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2SD1801 Folha de dados(PDF) 2 Page - ON Semiconductor |
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2SD1801 Folha de dados(HTML) 2 Page - ON Semiconductor |
2 / 10 page 2SB1201 / 2SD1801 No.2112-2/10 Continued from preceding page. Parameter Symbol Conditions Ratings Unit Collector Dissipation PC 0.8 W Tc=25°C15 W Junction Temperature Tj 150 °C Storage Temperature Tstg --55 to +150 °C Electrical Characteristics at Ta=25°C Parameter Symbol Conditions Ratings Unit min typ max Collector Cutoff Current ICBO VCB=(--)50V, IE=0A (--)100 nA Emitter Cutoff Current IEBO VEB=(--)4V, IC=0A (--)100 nA DC Current Gain hFE1VCE=(--)2V, IC=(--)100mA 100* 560* hFE2VCE=(--)2V, IC=(--)1.5A 40 Gain-Bandwidth Product fT VCE=(--)10V, IC=(--)50mA 150 MHz Output Capacitance Cob VCB=(--)10V, f=1MHz (22)12 pF Collector-to-Emitter Saturation Voltage VCE(sat) IC=(--)1A, IB=(--)50mA (--0.3)0.15 (--0.7)0.4 V Base-to-Emitter Saturation Voltage VBE(sat) VCE=(--)1A, IC=(--)50mA (--)0.9 (--)1.2 V Collector-to-Base Breakdown Voltage V(BR)CBO IC=(--)10μA, IE=0A (--)60 V Collector-to-Emitter Breakdown Voltage V(BR)CEO IC=(--)1mA, RBE=∞ (--)50 V Emitter-to-Base Breakdown Voltage V(BR)EBO IE=(--)10μA, IC=0A (--)6 V Turn-On Time ton See specified Test Circuit. 60 ns Storage Time tstg (450)550 ns Fall Time tf 30 ns * : The 2SB1201/2SD1801 are classified by 100mA hFE as follows : Rank R S T U hFE 100 to 200 140 to 280 200 to 400 280 to 560 Switching Time Test Circuit Ordering Information Device Package Shipping memo 2SB1201S-E TP 500pcs./bag Pb Free 2SB1201T-E TP 500pcs./bag 2SD1801S-E TP 500pcs./bag 2SD1801T-E TP 500pcs./bag 2SB1201S-TL-E TP-FA 700pcs./reel 2SB1201T-TL-E TP-FA 700pcs./reel 2SD1801S-TL-E TP-FA 700pcs./reel 2SD1801T-TL-E TP-FA 700pcs./reel VR RB VCC=25V VBE= --5V + + 50Ω INPUT RL 25Ω OUTPUT 100μF 470μF PW=20μs IB1 D.C. 1% IB2 IC=10IB1= --10IB2=500mA, VCC=25V For PNP, the polarity is reversed. Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
Nº de peça semelhante - 2SD1801 |
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Descrição semelhante - 2SD1801 |
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