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TLP3546 Folha de dados(PDF) 2 Page - Toshiba Semiconductor |
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TLP3546 Folha de dados(HTML) 2 Page - Toshiba Semiconductor |
2 / 9 page TLP3546 2 5. 5. 5. 5. Internal Circuit Internal Circuit Internal Circuit Internal Circuit Fig. Fig. Fig. Fig. 5.1 5.1 5.1 5.1 Internal Circuit Internal Circuit Internal Circuit Internal Circuit 6. 6. 6. 6. Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, T Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) LED Detector Common Characteristics Input forward current Input forward current derating Input forward current (pulsed) Input reverse voltage Input power dissipation Junction temperature OFF-state output terminal voltage ON-state current (A connection) ON-state current (B connection) ON-state current (C connection) ON-state current derating (A connection) ON-state current derating (B connection) ON-state current derating (C connection) ON-state current (pulsed) Output power dissipation Junction temperature Storage temperature Operating temperature Lead soldering temperature Isolation voltage (Ta ≥ 25) (100 µs pulse, 100 pps) (Ta ≥ 25) (Ta ≥ 25) (Ta ≥ 25) (t = 100 ms, Duty = 1/10) (10 s) AC, 1 min, R.H. ≤ 60% Symbol IF ∆IF/∆Ta IFP VR PD Tj VOFF ION ION ION ∆ION/∆Ta ∆ION/∆Ta ∆ION/∆Ta IONP PO Tj Tstg Topr Tsol BVS Note (Note 1) (Note 1) (Note 1) (Note 1) (Note 1) (Note 1) (Note 2) Rating 30 -0.3 1 5 50 125 100 2 2 4 -20 -20 -40 6 500 125 -55 to 125 -40 to 85 260 2500 Unit mA mA/ A V mW V A mA/ A mW Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: For an application circuit example, see Fig. 12.2. Note 2: This device is considered as a two-terminal device: Pins 1, 2 and 3 are shorted together, and pins 4, 5 and 6 are shorted together. 2012-03-16 Rev.3.0 |
Nº de peça semelhante - TLP3546 |
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Descrição semelhante - TLP3546 |
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