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ADC10D1000 Folha de dados(PDF) 1 Page - Texas Instruments

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Nome de Peças ADC10D1000
Descrição Electrónicos  Low Power, 10-Bit, Dual 1.0/1.5 GSPS or Single 2.0/3.0 GSPS ADC
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Fabricante Electrônico  TI1 [Texas Instruments]
Página de início  http://www.ti.com
Logo TI1 - Texas Instruments

ADC10D1000 Folha de dados(HTML) 1 Page - Texas Instruments

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ADC10D1000, ADC10D1500
www.ti.com
SNAS462Q – OCTOBER 2008 – REVISED MARCH 2013
ADC10D1000/ADC10D1500 Low Power, 10-Bit, Dual 1.0/1.5 GSPS or Single 2.0/3.0 GSPS
ADC
Check for Samples: ADC10D1000, ADC10D1500
1
FEATURES
DESCRIPTION
The ADC10D1000/1500 is the latest advance in TI's
2
Excellent Accuracy and Dynamic Performance
Ultra-High-Speed ADC family. This low-power, high-
Pin Compatible with ADC12D1000/1600/1800
performance
CMOS
analog-to-digital
converter
Low Power Consumption, Further Reduced at
digitizes signals at 10-bit resolution for dual channels
Lower Fs
at sampling rates of up to 1.0/1.5 GSPS (Non-DES
Mode) or for a single channel up to 2.0/3.0 GSPS
Internally Terminated, Buffered, Differential
(DES
Mode).
The
ADC10D1000/1500
achieves
Analog Inputs
excellent accuracy and dynamic performance while
R/W SPI Interface for Extended Control Mode
dissipating less than 2.8/3.6 Watts. The product is
Dual-Edge Sampling Mode, in Which the I- and
packaged in a leaded or lead-free 292-ball thermally
enhanced BGA package over the rated industrial
Q-channels Sample One Input at Twice the
temperature range of -40°C to +85°C.
Sampling Clock Rate
Test Patterns at Output for System Debug
The ADC10D1000/1500 builds upon the features,
architecture and functionality of the 8-bit GHz family
Programmable 15-bit Gain and 12-bit Plus Sign
of ADCs. An expanded feature set includes AutoSync
Offset
for multi-chip synchronization, 15-bit programmable
Programmable tAD Adjust Feature
gain and 12-bit plus sign programmable offset
1:1 Non-demuxed or 1:2 Demuxed LVDS
adjustment for each channel. The improved internal
track-and-hold
amplifier
and
the
extended
self-
Outputs
calibration scheme enable a very flat response of all
AutoSync Feature for Multi-Chip Systems
dynamic
parameters
beyond
Nyquist,
producing
Single 1.9V ± 0.1V Power Supply
9.1/9.0 Effective Number of Bits (ENOB) with a 100
292-Ball BGA Package (27mm x 27mm x
MHz input signal and a 1.0/1.5 GHz sample rate
while providing a 10-18 Code Error Rate (CER)
2.4mm with 1.27mm Ball-Pitch); No Heat Sink
Dissipating
a
typical
2.77/3.59
Watts
in
Non-
Required
Demultiplex Mode at 1.0/1.5 GSPS from a single
1.9V supply, this device is specified to have no
APPLICATIONS
missing codes over the full operating temperature
Wideband Communications
range.
Data Acquisition Systems
Each channel has its own independent DDR Data
Digital Oscilloscopes
Clock, DCLKI and DCLKQ, which are in phase when
both channels are powered up, so that only one Data
Clock could be used to capture all data, which is sent
out at the same rate as the input sample clock. If the
1:2 Demux Mode is selected, a second 10-bit LVDS
bus becomes active for each channel, such that the
output data rate is sent out two times slower to relax
data-capture timing requirements. The part can also
be used as a single 2.0/3.0 GSPS ADC to sample
one of the I or Q inputs. The output formatting can be
programmed to be offset binary or two's complement
and the Low Voltage Differential Signaling (LVDS)
digital outputs are compatible with IEEE 1596.3-1996,
with the exception of an adjustable common mode
voltage between 0.8V and 1.2V to allow for power
reduction for well-controlled back planes.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2008–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.


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