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CD54AC74 Folha de dados(PDF) 2 Page - Texas Instruments

Nome de Peças CD54AC74
Descrição Electrónicos  DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS
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Fabricante Electrônico  TI1 [Texas Instruments]
Página de início  http://www.ti.com
Logo TI1 - Texas Instruments

CD54AC74 Folha de dados(HTML) 2 Page - Texas Instruments

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CD54AC74, CD74AC74
DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS231D – SEPTEMBER 1998 – REVISED DECEMBER 2002
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic diagram, each flip-flop (positive logic)
TG
C
C
TG
C
C
TG
C
C
C
TG
C
C
PRE
CLK
D
CLR
Q
Q
C
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC
– 0.5 V to 6 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1)
±20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1)
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, IO (VO = 0 to VCC)
±50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through VCC or GND
±100 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
θJA (see Note 2): E package
80
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
M package
86
°C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, Tstg
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.


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