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ABSOLUTE MAXIMUM RATINGS

DAC8805

SBAS391A – DECEMBER 2006 – REVISED MAY 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

RELATIVE

DIFFERENTIAL

SPECIFIED

ACCURACY

NONLINEARITY

PACKAGE-LEAD

TEMPERATURE

PACKAGE

PRODUCT

(LSB)

(LSB)

(DESIGNATOR)

RANGE

MARKING

TSSOP-38

DAC8805Q

±1

±1

–40

°C to +125°C

DAC8805

(DBT)

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

DAC8805

UNIT

–0.3 to +7

V

Digital input voltage to GND

V

V

±25

V

Operating temperature range

–40 to +125

°C

Storage temperature range

–65 to +150

°C

+150

°C

Power dissipation

W

53

°C/W

Human Body Model (HBM)

4000

V

ESD rating

Charged Device Model (CDM)

500

V

(1)

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute

maximum conditions for extended periods may affect device reliability.

2

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