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SN74ABT18245 Folha de dados(PDF) 1 Page - Texas Instruments |
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SN74ABT18245 Folha de dados(HTML) 1 Page - Texas Instruments |
1 / 30 page SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 Copyright © 1995, Texas Instruments Incorporated 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 • Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes • State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation • Packaged in 380-mil Fine-Pitch Ceramic Flat Packages Using 25-mil Center-to-Center Spacings description The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE ™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, this device contains 18-bit noninverting bus transceivers. It can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE ™ bus transceivers. Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus depending upon the logic level at DIR. The output-enable (OE) can be used to disable the device so that the buses are effectively isolated. In the test mode, the normal operation of the SCOPE ™ bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990. SCOPE, Widebus, and EPIC- ΙΙB are trademarks of Texas Instruments Incorporated. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 1DIR 1B1 1B2 GND 1B3 1B4 VCC 1B5 1B6 1B7 GND 1B8 1B9 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 VCC 2B8 2B9 GND 2DIR TDO TMS 1OE 1A1 1A2 GND 1A3 1A4 VCC 1A5 1A6 1A7 GND 1A8 1A9 2A1 2A2 2A3 2A4 GND 2A5 2A6 2A7 VCC 2A8 2A9 GND 2OE TDI TCK SN54ABT18245 . . . WD PACKAGE (TOP VIEW) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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Descrição semelhante - SN74ABT18245 |
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