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SN74ABT18245 Folha de dados(PDF) 1 Page - Texas Instruments

Nome de Peças SN74ABT18245
Descrição Electrónicos  SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
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Fabricante Electrônico  TI1 [Texas Instruments]
Página de início  http://www.ti.com
Logo TI1 - Texas Instruments

SN74ABT18245 Folha de dados(HTML) 1 Page - Texas Instruments

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SN54ABT18245
SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
SGBS307A – AUGUST 1994 – REVISED JANUARY 1995
Copyright
© 1995, Texas Instruments Incorporated
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POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Member of the Texas Instruments SCOPE ™
Family of Testability Products
Member of the Texas Instruments
Widebus
™ Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
Packaged in 380-mil Fine-Pitch
Ceramic Flat Packages Using 25-mil
Center-to-Center Spacings
description
The SN54ABT18245 scan test device with 18-bit
bus transceivers is a member of the Texas
Instruments SCOPE
™ testability integrated circuit
family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan
access to the test circuitry is accomplished via the
4-wire test access port (TAP) interface.
In the normal mode, this device contains 18-bit noninverting bus transceivers. It can be used either as two 9-bit
transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples
of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP
in the normal mode does not affect the functional operation of the SCOPE
™ bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus depending upon the logic level at DIR. The
output-enable (OE) can be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPE
™ bus transceivers is inhibited and the test circuitry is
enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs
boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
SCOPE, Widebus, and EPIC-
ΙΙB are trademarks of Texas Instruments Incorporated.
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1DIR
1B1
1B2
GND
1B3
1B4
VCC
1B5
1B6
1B7
GND
1B8
1B9
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
VCC
2B8
2B9
GND
2DIR
TDO
TMS
1OE
1A1
1A2
GND
1A3
1A4
VCC
1A5
1A6
1A7
GND
1A8
1A9
2A1
2A2
2A3
2A4
GND
2A5
2A6
2A7
VCC
2A8
2A9
GND
2OE
TDI
TCK
SN54ABT18245 . . . WD PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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