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AMIS-49587 Folha de dados(PDF) 11 Page - ON Semiconductor |
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AMIS-49587 Folha de dados(HTML) 11 Page - ON Semiconductor |
11 / 56 page AMIS−49587 www.onsemi.com 11 4 ELECTRICAL CHARACTERISTICS 4.1 DC AND AC CHARACTERISTICS 4.1.1 Oscillator: Pin XIN, XOUT In production the actual oscillation of the oscillator and duty cycle will not be tested. The production test will be based on the static parameters and the inversion from XIN to XOUT in order to guarantee the functionality of the oscillator. Table 8. OSCILLATOR Parameter Test Conditions Symbol Min Typ Max Unit Crystal frequency (Note 1) fCLK −100 ppm 24 +100 ppm MHz Duty cycle with quartz connected (Note 1) 40 61 % Start−up time (Note 1) Tstartup 50 ms Maximum Capacitive load on XOUT XIN used as clock input CLXOUT 50 pF Low input threshold voltage XIN used as clock input VILXOUT 0.3 VDD V High input threshold voltage XIN used as clock input VIHXOUT 0.7 VDD V Low output voltage XIN used as clock input, XOUT = 2 mA VOLXOUT 0.3 V High input voltage XIN used as clock input VOHXOUT VDD−0.3 V 1. Guaranteed by design. Maximum allowed series loss resistance up to 80 W. 4.1.2 Zero Crossing Detector and 50/60 Hz PLL: Pin M50HZ_IN Table 9. ZERO CROSSING DETECTOR AND 50/60 Hz PLL Parameter Test Conditions Symbol Min Typ Max Unit Maximum peak input current ImpM50HZIN −20 20 mA Maximum average input current During 1 ms ImavgM50HZIN −2 2 mA Mains voltage (ms) range With protection resistor at M50HZIN VMAINS 90 550 V Rising threshold level (Note 2) VIRM50HZIN 1.9 V Falling threshold level (Note 2) VIFM50HZIN 0.82 V Hysteresis (Note 2) VHY50HZIN 0.4 V Lock range for 50 Hz (Note 3) MAINS_FREQ = 0 (50 Hz) Flock50Hz 45 55 Hz Lock range for 60 Hz (Note 3) MAINS_FREQ = 0 (60 Hz) Flock60Hz 54 66 Hz Lock time (Note 3) MAINS_FREQ = 0 (50 Hz) Tlock50Hz 15 s Lock time (Note 3) MAINS_FREQ = 0 (60 Hz) Tlock60Hz 20 s Frequency variation without going out of lock (Note 3) MAINS_FREQ = 0 (50 Hz) DF60Hz 0.1 Hz/s Frequency variation without going out of lock (Note 3) MAINS_FREQ = 0 (60 Hz) DF50Hz 0.1 Hz/s Jitter of CHIP_CLK (Note 3) JitterCHIP_CLK −25 25 ms 2. Measured relative to VSS. 3. These parameters will not be measured in production since the performance is totally dependent of a digital circuit which will be guaranteed by the digital test patterns. |
Nº de peça semelhante - AMIS-49587_15 |
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Descrição semelhante - AMIS-49587_15 |
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