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CS35L32 Folha de dados(PDF) 11 Page - Cirrus Logic

Nome de Peças CS35L32
Descrição Electrónicos  Boosted Class D Amplifier with Speaker-Protection Monitoring and Flash LED Drivers
Download  51 Pages
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Fabricante Electrônico  CIRRUS [Cirrus Logic]
Página de início  http://www.cirrus.com
Logo CIRRUS - Cirrus Logic

CS35L32 Folha de dados(HTML) 11 Page - Cirrus Logic

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CS35L32
3 Characteristics and Specifications
Table 3-7. Signal Monitoring Characteristics
Test conditions, except where noted otherwise: VA = 1.8 V, VP = 3.6 V, VBST = 5.0 V, amp gain = 12 dB, 0.1-
 sense resistor, GNDA = GNDP = 0 V,
TA = +25°C. Measurement bandwidth is 20 Hz to 20 kHz, Fs = 48 kHz, Input Signal = 1 kHz, MCLKINT = 6 MHz, MCLKINT is explained in Section 4.13.1
and Section 7.7.
Parameters
Min
Typical
Max
Units
General ADC characteristics
Power-up time: tPUP(ADC)
—8.5
[1]
1.Typical value is specified with PDN_AMP and PDN_xMON bits initially set. Maximum power-up time is affected by the actual MCLKINT frequency.
ms
VSENSE± monitoring
characteristics (VMON)
Data width
16
Bits
Dynamic range (unweighted), VSENSE± = ±5.0 V (10 VPP)—
60
dB 2
2.Parameters given in dB are referred to the applicable typical full-scale voltages. Applies to all THD+N and resolution values in the table
Total harmonic distortion + noise, –3.8 dBFS 3
3.VSENSE± THD is measured with the Class D amplifier as the audio source connected to an
8-
 + 33H speaker load, supplied by a 6.3-VPP, 1-kHz
sine wave, operating under the typical performance test conditions to produce a large, unclipped audio signal. This setup produces a –3.8-dBFS
VMON output. Larger Class D amplifier amplitudes begin to exhibit clipping behavior, increasing distortion of the signal supplied to VSENSE±
–60
dB 2
Full-scale signal input voltage 6.59•VA 6.94•VA 7.29•VA VPP
Common-mode rejection ratio (217 Hz @ 500 mVPP) 4
4.CMRR test setup for VSENSE±:
—60—
dB 2
Group delay 5
5.VMON group delay is measured from the time a signal is presented on the VSENSE± and pins until the MSB of the digitized signal exits the serial
port. Fs is the LRCK rate.
—7.6/Fs—
s
ISENSE± monitoring
characteristics (IMON)
Data width
16
Bits
Dynamic range (unweighted), ISENSE± = ±0.625 A (1.25 APP)—
56
dB 2
Total harmonic distortion, –29.5 dBFS 6
6.For reference, injecting a 125-mVpp fully differential sine wave into the ISENSE± pins (equivalent to a ±0.625 A current with a 0.1-
 ISENSE resistor)
produces an IMON output of –29.5 dBFS (since typical full-scale is 1.64*VA, in VPP). ISENSE± monitoring THD is measured using the Class D
amplifier as the audio source, which is connected to an 8-
 + 33-H speaker load, supplied by a 7.0-VPP, 1-kHz sine wave, operating under the
typical performance test conditions to produce a large, unclipped audio signal. This setup produces a –29.5-dBFS amplitude IMON output. Larger
Class D amplifier amplitudes begin to exhibit clipping behavior, increasing the distortion of the signal supplied to ISENSE±.
–45
dB 2
Full-scale signal input voltage 1.56•VA 1.64•VA 1.72•VA VPP
VMON-to-IMON isolation 7
7.
VMON-to-IMON isolation is the error in the current sense due to VMON, expressed relative to full-scale sense current in decibels.
—56—
dB 2
Group delay 8
8.IMON group delay is measured from when a signal is presented on the ISENSE± pins until the MSB of the digitized signal exits the serial port. Fs is
the LRCK rate.
—7.6/Fs—
s
VP monitoring characteristics
Data width
8
Bits
Voltage resolution (See the equation in Section 4.8.4.)
35.3
mV
(FF code) signal input voltage (VP) 2.89•VA 3.05•VA 3.20•VA
V
VPMON = 1011 0011
VPMON = 1011 0100
VPMON = 1111 1111
VPMON = 0000 0000
2.8
2.835
5.482
5.518
V
V
V
V
Table 3-8. Digital Interface Specifications and Characteristics
Test conditions, except where noted otherwise: VA = 1.8 V, VP = 3.6 V, VBST = 5.0 V, GNDA = GNDP = 0 V, TA = +25°C.
Parameters
Symbol
Test Conditions
Min
Max
Units
Input leakage current (per pin) 1,2
1.Specification includes current through internal pull up/down resistors, where applicable (as defined in Section 1).
2.Leakage current is measured with VA = 1.80 V, VP = 3.60 V, VBST = 3.60 V, and RESET asserted. Each pin is tested while driven high and low.
FLOUT2/AD0
FLEN, FLINH, LRCK
MCLK, SCLK, SDOUT
SCL, SDA, INT, RESET
IIN
±7.5
±4.5
±4.5
±0.1
A
A
A
A
Input capacitance
IIN
10
pF
VA logic I/Os
High-level output voltage
VOH
IOH = –67/–100 A 3
3.For the ADSP output SDOUT and potential outputs SCLK and LRCK (if M/S = 1), if ADSP_DRIVE = 0 see Section 7.13, IOH and IOL are –100 and
+100
A. If ADSP_DRIVE = 1, IOH and IOL are –67 and +67 A. For other, non-ADSP_DRIVE-affected outputs, IOH and IOLare –100 and +100 A.
VA–0.2
V
Low-level output voltage
VOL
All outputs, IOL = 67/100 A 3
INT, SDA, IOL = 3 mA
0.20
0.4
V
V
High-level input voltage
VIH
—0.70•VA
V
Low-level input voltage
VIL
0.30•VA
V
VSENSE+
217 Hz
500 mVPP
DC Offset = 0
VSENSE–


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