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6N134 Folha de dados(PDF) 11 Page - Broadcom Corporation.

Nome de Peças 6N134
Descrição Electrónicos  Hermetically Sealed, High Speed, High CMR, Logic Gate Optocouplers
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Fabricante Electrônico  BOARDCOM [Broadcom Corporation.]
Página de início  http://www.broadcom.com
Logo BOARDCOM - Broadcom Corporation.

6N134 Folha de dados(HTML) 11 Page - Broadcom Corporation.

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Broadcom
- 11 -
6N134, 81028, HCPL-563x, HCPL-663x, HCPL-565x, 5962-98001, HCPL-268K, HCPL-665x,
5962-90855, HCPL-560x
Data Sheet
Electrical Characteristics (TA = –55°C to +125°C, unless Otherwise Specified)
Single Channel Product Only
a.
Commercial parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and 55°C (Subgroups 1 and 9, 2 and
10, 3 and 11, respectively).
b.
All typical values are at VCC = 5 V, TA = 25°C.
c.
Each channel.
d.
It is essential that a bypass capacitor (0.01 to 0.1 μF ceramic) be connected from VCC to ground. Total lead length between both ends of this external capacitor
and the isolator connections should not exceed 20 mm.
e.
The HCPL-6630, HCPL-6631, and HCPL-663K dual channel parts function as two independent single channel units. Use the single channel parameter limits
for each channel.
f.
Not required for 6N134, 6N134/883B, 8102801, HCPL-268K, and 5962-9800101 types.
g.
Required for 6N134, 6N134/883B, 8102801, HCPL-268K, and 5962-9800101 types.
h.
All devices are considered two-terminal devices; II-O is measured between all input leads or terminals shorted together and all output leads or terminals
shorted together.
i.
This is a momentary withstand test, not an operating condition.
j.
Not required for HCPL-5650, HCPL-5651, and 8102805 types.
k.
Required for HCPL-5650, HCPL-5651, and 8102805 types only.
l.
Measured between each input pair shorted together and all output connections for that channel shorted together.
m.
Parameters are tested as part of device initial characterization and after design and process changes. Parameters are guaranteed to limits specified for all lots
not specifically tested.
n.
tPHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the output pulse.
The tPLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.5 V point on the trailing edge of the output pulse.
o.
CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (VO< 0.8 V). CMH is the
maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic high state (VO > 2.0 V).
Parameter
Symbol Test Conditions
Group Aa
Subgroups
a.
Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and 55°C (Subgroups 1 and 9, 2 and
10, 3 and 11, respectively).
Limits
Units
Fig.
Note
Min.
Typ.b
b.
All typical values are at VCC = 5 V, TA = 25°C.
Max.
Low Level Enable Current
IEL
VCC = 5.5 V,
VE = 0.5 V
1, 2, 3
–2.0
–1.45
mA
High Level Enable Voltage
VEH
1, 2, 3
2.0
V
c
c.
No external pull up is required for a high logic state on the enable input.
Low Level Enable Voltage
VEL
1, 2, 3
0.8
V


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